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   PO BOX 342343    Austin,   Texas    78734
 Specialty Wafer Evaluation and Processing

Semiconductor Equipment (Front-end) Resale, Inspection, and Valuation
 

Available Equipment

 

Manufacturer

Model Number

Description

 ADE9700Wafer flatness, shape and thickness metrology
 Advanced EnergyPDW 2200RF Generator ( P/N 3156011-002 Rev A )
 Advanced EnergyPDX 50005 KW MF Generator P/N 27-113711-00
 AffinityCWA-300L-MP15CBD4Chiller P/N 31796
 Alcatel2008AWet Pump
 Applied Materials5500Endura Sputtering System
 Applied Materials7810RPEpi Reactor
 Applied MaterialsP5000Tungsten CVD System
 Applied Materials5500Endura Sputtering System - 6"
 Asyst9700-7187-01Load Port
 AsystLPT 2200Load Port
 AsystSMIF 300FLLoad Port
 Axcelis/Fusion150PCPhotostabilizer
 Blue M990C-P-F-HPOven
 Brooks AutomationFixload V6Load Port
 CTI8510Cryo Compressor
 CTISCWCryo Compressor
 DNSSSW60A-ARScrubber
 Drytek384TTriode Etcher
 EbaraAA10Dry Pump
 EbaraA07VDry Pump
 EbaraA10SDry Pump
 EbaraA30WDry Pump
 EbaraA150W-TDry Pump
 EdwardsE2M18Wet Pump
 EdwardsE2M80Wet Pump
 ENIOEM 25ARF Generator
 GasonicsL3510Asher
 GasonicsPEP 3510Dual chamber Microwave Asher set up for 8" wafers. 1.25kW Astex Microwave Generators
 KensingtonCSMT-2Wafer Sorter
 KLA-TencorAS 200Profilometer - Alphastep 200
 KLA-Tencor2608Wafer Review Station
 KLA-Tencor5400Film Stress Measurement System
 KLA-Tencor5200Overlay Measurement System
 KLA-Tencor7700MSurfscan
 KLA-Tencor7700Surfscan
 KLA-Tencor8100XPCD Sem
 KLA-TencorRS 100Resistivity Measurement System
 KLA-TencorSP-1 TBIResistivity Measurement System
 KLA-TencorRS-100Resistivity Measurement System
 KLA-TencorUV1250SEFilm Thickness Measurement System
 KLA-TencorUV1270SEFilm Thickness Measurement System
 KLA-TencorAIT XP+Patterned wafer inspection. In-line defect inspection system that offers exceptional defect sensitivity and hight throughput. De
 Lam9408SEPoly Etcher
 LamEnvisionComputer
 Lam4520XLOxide Etcher
 LamAlliance A6 - 9400 DFMEtch Cluster tool
 LeicaReichert Polyvar 300901Microscope - with Kinetek
 MactronixBBS-613Wafer Transfer System
 MactronixUKA 650Wafer Transfer System
 MactronixUKA 650A3Wafer Transfer System
 MattsonAspen IIICP Asher
 MGIET-1000Wafer Transfer System
 Nanometrics4000Film Thickness Measurement System
 Nanometrics212Film Thickness Measurement System
 NeslabHX-75Air Cooled Chiller
 NeslabHX-500Water Cooled Chiller
 NikonOptistation 3ABright Light Inspection System
 NovellusC1-150PECVD System
 OnTrakDSS 200 Series 0Scrubber
 OnTrakDSS 200 Series 2Scrubber
 SemifabCD 200TCU
 SemifabCD 200-2TELTCU
 SemitoolSST421280FResist Stripper
 SemitoolWSST606AResist Stripper
 Semix/TazmoTRS6132USOG System
 Sloan Dektak3STProfilometer
 TeplaAuto 300Asher
 Thermawave3290DUVIFilm Thickness Measurement System
 Tokyo ElectronIRAS LithiusInterface
 VarianTurbo V250Turbo Pump
 Verteq1800Single Stack SRD
 ZeissAxiotronMicroscope

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